Document Details Document Type : Article In Journal  Document Title : Resolution degradation of semiconductor detectors إنحلال قدرة الكشف للكواشف الشبه موصلة بسبب اصطياد حوامل الشحنة   Subject : semiconductors  Document Language : English  Abstract : Incomplete charge collection in semiconductor X-ray detectors due to carrier trapping is recognized as an important source of signal broadening. In this paper we show the results of calculations of energy resolution for a TlBr detector using an analytic approach developed in our earlier work in which fluctuations in the distribution of photon absorption sites are related to fluctuations in the collected charge. Using measured values of transport parameters for electrons and holes in the detector material we obtained excellent agreement with experiment in the X-ray energy range 6–660 keV.  ISSN : 1012-8832  Journal Name : Nuclear Instruments and Methods in Physics Research A  Volume : 19  Issue Number : 2  Publishing Year : 1425 AH 2005 AD  Article Type : Article  Added Date : Monday, August 4, 2008  Researchers Researcher Name (Arabic) Researcher Name (English) Researcher Type Dr Grade Email أليكس ج. كوزوريزوف Kozorezov, Alix G. Investigator Doctorate   هالة عبد العزيز الجوهري Al-Jawhari, Hala Abdulaziz Researcher Doctorate   Files File Name Type Description  Paper 2.pdf pdf   Back To Researches Page